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SILICON CARBIDE AND AGILE OPTICS BASED SENSORS FOR POWER PLANT GAS TURBINES, LASER BEAM ANALYSIS AND BIOMEDICINE
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Title
SILICON
CARBIDE
AND
AGILE
OPTICS
BASED
SENSORS
FOR
POWER
PLANT
GAS
TURBINES
,
LASER
BEAM
ANALYSIS
AND
BIOMEDICINE
Author
Sheikh, Mumtaz
Keywords
Silicon Carbide
Optical Sensors
Gaussian Beams
Laser Beam Measurements
Confocal Microscopy
Variable Focus Lenses
Abstract
Proposed
are
novel
sensors
for
extreme
environment
power
plants
,
laser
beam
analysis
and
biomedicine.
A
hybrid
wireless-wired
extreme
environment
temperature
sensor
using
a
thick
single-crystal
Silicon
Carbide
(SiC)
chip
embedded
inside
a
sintered
SiC
probe
design
is
investigated
and
experimentally
demonstrated.
The
sensor
probe
employs
the
SiC
chip
as a
Fabry-Perot
(FP)
interferometer
to
measure
the
change
in
refractive
index
and
thickness
of
SiC
with
temperature.
A
novel
temperature
sensing
method
that
combines
wavelength-tuned
signal
processing
for
coarse
measurements
and
classical
FP
etalon
peak
shift
for
fine
measurements
is
proposed
and
demonstrated.
This
method
gives
direct
unambiguous
temperature
measurements
with a
high
temperature
resolution
over
a
wide
temperature
range.
An
alternative
method
using
blackbody
radiation
from a
SiC
chip
in a
two-color
pyrometer
configuration
for
coarse
temperature
measurement
and
classical
FP
laser
interferometry
via
the
same
chip
for
fine
temperature
measurement
is
also
proposed
and
demonstrated.
The
sensor
design
is
successfully
deployed
in an
industrial
test
rig
environment
with
gas
temperatures
exceeding
1200
C.
This
sensor
is
proposed
as an
alternate
to
all-electrical
thermocouples
that are
susceptible
to
severe
reliability
and
lifetime
issues
in
such
extreme
environments.
A
few
components
non-contact
thickness
measurement
system
for
optical
quality
semi-transparent
samples
such
as
Silicon
(Si)
and
6H
SiC
optical
chips
such
as the
one
used
in the
design
of this
sensor
is
proposed
and
demonstrated.
The
proposed
system
is
self-calibrating
and
ensures
a
true
thickness
measurement
by
taking
into
account
material
dispersion
in the
wavelength
band
of
operation.
For the
first
time
, a
100%
repeatable
all-digital
electronically-controlled
pinhole
laser
beam
profiling
system
using
a
Texas
Instruments
(TI)
Digital
Micro-mirror
Device
(DMD)
commonly
used
in
projectors
is
experimentally
demonstrated
using
a
unique
liquid
crystal
image
generation
system
with
non-invasive
qualities.
Also
proposed
and
demonstrated
is
the
first
motion-free
electronically-controlled
beam
propagation
analyzer
system
using
a
TI
DMD
and a
variable
focus
liquid
lens.
The
system
can
be
used
to
find
all
the
parameters
of a
laser
beam
including
minimum
waist
size
,
minimum
waist
location
and the
beam
propagation
parameter
M2.
Given
the
all-digital
nature
of
DMD-based
profiling
and
all-analog
motion-free
nature
of the
Electronically
Controlled
Variable
Focus
Lens
(ECVFL)
beam
focus
control
, the
proposed
analyzer
versus
prior-art
promises
better
repeatability
,
speed
and
reliability.
For the
first
time
,
Three
Dimensional
(3-D)
imaging
is
demonstrated
using
an
electronically
controlled
Liquid
Crystal
(LC)
optical
lens
to
accomplish
a
no-moving
parts
depth
section
scanning
in a
modified
commercial
3-D
confocal
microscope.
The
proposed
microscopy
system
within
aberration
limits
has the
potential
to
eliminate
the
sample
or
objective
motion-caused
mechanical
forces
that
can
distort
the
original
sample
structure
and
lead
to
imaging
errors.
A
signal
processing
method
for
realizing
high
resolution
three
dimensional
(3-D)
optical
imaging
using
diffraction
limited
low
resolution
optical
signals
is
also
proposed.
Adviser
Riza, Nabeel
Publisher
University
of
Central
Florida
Degree
Ph.D.
Degree Discipline
Optics and Photonics
Degree Grantor
Optics and Photonics
Degree Program
Optics PhD
Graduation Date
2009-01-01
Type
Doctoral dissertation
Access Level
Campus - Allow Only UCF Community Access
Release Date
2010-11-01
Repository
University Archives
Repository Collection
Electronic Theses and Dissertations
Identifier
CFE0002922
Access Link
http://purl.fcla.edu/fcla/etd/CFE0002922
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