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TUNABLE TERAHERTZ DETECTORS BASED ON PLASMON EXCIATION IN TWO DIMENSIONAL ELECTRON GASES IN INGAAS/INP AND ALGAN/GAN HEMT
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TitleTUNABLE TERAHERTZ DETECTORS BASED ON PLASMON EXCIATION IN TWO DIMENSIONAL ELECTRON GASES IN INGAAS/INP AND ALGAN/GAN HEMT
AuthorSaxena, Himanshu
KeywordsHEMT
Plasmon
THz
2deg
InGaAs/InP
Heterostructure
AbstractThe observation of voltage-tunable plasmon resonances in the terahertz range in two dimensional electron gas (2-deg) of a high electron mobility transistor (HEMT) fabricated from the InGaAs/InP and AlGaN/GaN materials systems is reported. The devices were fabricated from a commercial HEMT wafer by depositing source and drain contacts using standard photolithography process and a semi-transparent gate contact that consisted of a 0.5 �m period transmission grating formed by electron-beam lithography. Narrow-band resonant absorption of THz radiation was observed in transmission in the frequency range 10�100 cm-1. The resonance frequency depends on the gate voltage-tuned sheet-charge density of the 2deg. The fundamental and higher resonant harmonics were observed to shift towards lower frequencies with the implementation of negative gate bias. The theory of interaction of sub millimeter waves with 2deg through corrugated structure on top has been applied to calculate and understand the phenomena of resonant plasmon excitations. The observed separation of resonance fundamental from its harmonics and their shift with gate bias follows theory, although the absolute frequencies are lower by about a factor of 2-3 in InGaAs/InP system. However, calculated values match much better with AlGaN/GaN system.
AdviserPeale, Robert
PublisherUniversity of Central Florida
DegreePh.D.
Degree DisciplineDepartment of Physics
Degree GrantorSciences
Degree ProgramPhysics PhD
Graduation Date2009-01-01
TypeDoctoral dissertation
Access LevelPublic - Allow Worldwide Access
Release Date2010-02-05
RepositoryUniversity Archives
Repository CollectionElectronic Theses and Dissertations
IdentifierCFE0002912
Access Linkhttp://purl.fcla.edu/fcla/etd/CFE0002912

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