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Degradation
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Release Date
2007-12-01
(3)
2008-12-20
(3)
2009-05-21
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2010-02-05
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2010-05-07
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Author
Agarwal, Rohit
(1)
Altif, Jessica
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Atanassova, Martina
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Breininger, David
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Chua, Chin Boon
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1.
FUNDAMENTAL STUDY OF MECHANICAL AND CHEMICAL DEGRADATION MECHANISMS OF PEM FUEL CELL MEMBRANES
2.
ENVIRONMENTAL DEGRADATION OF OXIDATION RESISTANT AND THERMAL BARRIER COATINGS FOR FUEL-FLEXIBLE GAS TURBINE APPLICATIONS
3.
PREVENTION OF ENVIRONMENTALLY INDUCED DEGRADATION IN CARBON/EPOXY COMPOSITE MATERIAL VIA IMPLEMENTATION OF A POLYMER BASED COATI
4.
HOT CARRIER EFFECT ON LDMOS TRANSISTORS
5.
STUDY OF OXIDE BREAKDOWN, HOT CARRIER AND NBTI EFFECTS ON MOS DEVICE AND CIRCUIT RELIABILITY
6.
MODELING AND SIMULATION OF LONG TERM DEGRADATION AND LIFETIME OF DEEP-SUBMICRON MOS DEVICE AND CIRCUIT
7.
HIGH VOLTAGE BIAS TESTING AND DEGRADATION ANALYSIS OF PHOTOVOLTAIC MODULES
8.
OPTIMIZING THE PERFORMANCE OF AS-MANUFACTURED GRAZING INCIDENCE X-RAY TELESCOPES USING MOSAIC DETECTOR ARRAYS
9.
THE BIOCHEMICAL REACTIONS OF DRY STATE DNA
10.
APPLICATION OF ABSORPTIVE TREATMENTS ON TRAFFIC NOISE BARRIERS IN FLORIDA
11.
PREPARATION AND CHARACTERISATION OF STABILIZED NAFION/PHOSPHOTUNGSTIC ACID COMPOSITE MEMBRANES FOR PROTON EXCHANGE MEMBRANE FUEL
12.
STUDY OF NANOSCALE CMOS DEVICE AND CIRCUIT RELIABILITY
13.
Mechanisms of lifetime improvement in Thermal Barrier Coatings with Hf and/or Y modification of CMSX-4 superalloy substrates
14.
ESTABLISHING DEGRADATION RATES AND SERVICE LIFETIME OF PHOTOVOLTAIC SYSTEMS
15.
DEGRADATION OF HALOGENATED ALIPHATIC COMPOUNDS IN SEQUENTIAL ANAEROBIC
16.
CELLULAR AND MOLECULAR MECHANISMS OF TOXIN RESISTANCE FOR ENDOPLASMIC RETICULUM TRANSLOCATING TOXINS
17.
THE EFFECT OF HOT CARRIER STRESS ON LOW NOISE AMPLIFIER RADIO FREQUENCY PERFORMANCE UNDER WEAK AND STRONG INVERSION
18.
NON-DESTRUCTIVE MICROSTRUCTURAL EVALUATION OF YTTRIA STABILIZED ZIRCONIA, NICKEL ALUMINIDES AND THERMAL BARRIER COATINGS USING ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY
19.
Negative bias temperature instability and charge trapping effects on analog and digital circuit reliability
20.
THE STRUCTURAL AND FOLDING CHARACTERISTICS OF THE PLASMID-ENCODED TOXIN FROM ENTEROAGGREGATIVE ESCHERICHIA COLI
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